High-Resolution X-Ray Scattering PDF
By:Ullrich Pietsch,Vaclav Holy,Tilo Baumbach
Published on 2004-08-27 by Springer Science & Business Media
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During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
This Book was ranked at 40 by Google Books for keyword Resolution.
Book ID of High-Resolution X-Ray Scattering's Books is p8r9PpdpYrAC, Book which was written byUllrich Pietsch,Vaclav Holy,Tilo Baumbachhave ETAG "LF6ylbSy2mw"
Book which was published by Springer Science & Business Media since 2004-08-27 have ISBNs, ISBN 13 Code is 9780387400921 and ISBN 10 Code is 0387400923
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Book which have "408 Pages" is Printed at BOOK under CategoryTechnology and Engineering
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